Deep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on apples

原标题

Deep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on apples

证据状态

relation_layer

D — 背景

relation_confidence

2 — 强

relevance_status

已纳入

body_status

部分文本或摘要

doi_status

已确认

access_status

仅元数据

expert_review

已纳入

verification_status

元数据已核验

详情

year

2021

type

会议论文

venue

2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

DOI

10.1109/i2mtc50364.2021.9460071

人物

• Nikita Stasenko
• Elizaveta Chernova
• Dmitrii Shadrin
• George Ovchinnikov
• И. П. Криволапов
• Mariia Pukalchik

主题

• Калибровка и валидация
• Экспериментальная база
• Прогнозирование и поддержка решений
• ГИС и дистанционное зондирование

来源

• IEEE proceedings record and exact-profile abstract: spoiled-area segmentation in apples, 2021

外部链接

• https://doi.org/10.1109/i2mtc50364.2021.9460071