S000857IEEE proceedings record and exact-profile abstract: spoiled-area segmentation in apples, 2021详情source_class出版商authority_level二手来源accessed_at2026-07-29https://doi.org/10.1109/i2mtc50364.2021.9460071出版物Deep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on apples报告此记录的更正