S000857IEEE proceedings record and exact-profile abstract: spoiled-area segmentation in apples, 2021Detallessource_classEditorialauthority_levelFuente secundariaaccessed_at2026-07-29https://doi.org/10.1109/i2mtc50364.2021.9460071PublicacionesDeep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on applesComunicar una corrección para este registro