Deep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on apples

Título original

Deep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on apples

Estados de evidencia

relation_layer

D — contexto

relation_confidence

2 — fuerte

relevance_status

Incluido

body_status

Texto parcial o resumen

doi_status

Confirmado

access_status

Solo metadatos

expert_review

Incluido

verification_status

Metadatos verificados

Detalles

year

2021

type

Artículo de conferencia

venue

2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

DOI

10.1109/i2mtc50364.2021.9460071

Personas

• Nikita Stasenko
• Elizaveta Chernova
• Dmitrii Shadrin
• George Ovchinnikov
• И. П. Криволапов
• Mariia Pukalchik

Temas

• Калибровка и валидация
• Экспериментальная база
• Прогнозирование и поддержка решений
• ГИС и дистанционное зондирование

Fuentes

• IEEE proceedings record and exact-profile abstract: spoiled-area segmentation in apples, 2021

Enlaces externos

• https://doi.org/10.1109/i2mtc50364.2021.9460071