Deep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on apples

Original title

Deep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on apples

Evidence statuses

relation_layer

D — context

relation_confidence

2 — strong

relevance_status

Included

body_status

Partial text or abstract

doi_status

Confirmed

access_status

Metadata only

expert_review

Included

verification_status

Metadata verified

Details

year

2021

type

Conference paper

venue

2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

DOI

10.1109/i2mtc50364.2021.9460071

People

• Nikita Stasenko
• Elizaveta Chernova
• Dmitrii Shadrin
• George Ovchinnikov
• И. П. Криволапов
• Mariia Pukalchik

Topics

• Calibration and validation
• Experimental basis
• Forecasting and decision support
• GIS and remote sensing

Sources

• IEEE proceedings record and exact-profile abstract: spoiled-area segmentation in apples, 2021

External links

• https://doi.org/10.1109/i2mtc50364.2021.9460071