S000857IEEE proceedings record and exact-profile abstract: spoiled-area segmentation in apples, 2021Detailssource_classPublisherauthority_levelSecondary sourceaccessed_at2026-07-29https://doi.org/10.1109/i2mtc50364.2021.9460071WorksDeep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on applesReport a correction for this record