Deep Learning for Postharvest Decay Prediction in Apples

Título original

Deep Learning for Postharvest Decay Prediction in Apples

Estados de evidencia

relation_layer

D — contexto

relation_confidence

2 — fuerte

relevance_status

Incluido

body_status

Texto parcial o resumen

doi_status

Confirmado

access_status

Solo metadatos

expert_review

Incluido

verification_status

Metadatos verificados

Detalles

year

2021

type

Artículo de conferencia

venue

IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society

DOI

10.1109/iecon48115.2021.9589498

Personas

• Nikita Stasenko
• Maxim Savinov
• Valeriy Burlutskiy
• Mariia Pukalchik
• Andrey Somov

Temas

• Калибровка и валидация
• Экспериментальная база
• Прогнозирование и поддержка решений
• ГИС и дистанционное зондирование

Fuentes

• IEEE proceedings record and exact-profile abstract: postharvest apple decay prediction, 2021

Enlaces externos

• https://doi.org/10.1109/iecon48115.2021.9589498