Deep Learning for Postharvest Decay Prediction in Apples

原标题

Deep Learning for Postharvest Decay Prediction in Apples

证据状态

relation_layer

D — 背景

relation_confidence

2 — 强

relevance_status

已纳入

body_status

部分文本或摘要

doi_status

已确认

access_status

仅元数据

expert_review

已纳入

verification_status

元数据已核验

详情

year

2021

type

会议论文

venue

IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society

DOI

10.1109/iecon48115.2021.9589498

人物

• Nikita Stasenko
• Maxim Savinov
• Valeriy Burlutskiy
• Mariia Pukalchik
• Andrey Somov

主题

• Калибровка и валидация
• Экспериментальная база
• Прогнозирование и поддержка решений
• ГИС и дистанционное зондирование

来源

• IEEE proceedings record and exact-profile abstract: postharvest apple decay prediction, 2021

外部链接

• https://doi.org/10.1109/iecon48115.2021.9589498