Deep Learning for Postharvest Decay Prediction in Apples

Original title

Deep Learning for Postharvest Decay Prediction in Apples

Evidence statuses

relation_layer

D — context

relation_confidence

2 — strong

relevance_status

Included

body_status

Partial text or abstract

doi_status

Confirmed

access_status

Metadata only

expert_review

Included

verification_status

Metadata verified

Details

year

2021

type

Conference paper

venue

IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society

DOI

10.1109/iecon48115.2021.9589498

People

• Nikita Stasenko
• Maxim Savinov
• Valeriy Burlutskiy
• Mariia Pukalchik
• Andrey Somov

Topics

• Calibration and validation
• Experimental basis
• Forecasting and decision support
• GIS and remote sensing

Sources

• IEEE proceedings record and exact-profile abstract: postharvest apple decay prediction, 2021

External links

• https://doi.org/10.1109/iecon48115.2021.9589498