S000858IEEE proceedings record and exact-profile abstract: postharvest apple decay prediction, 2021Detallessource_classEditorialauthority_levelFuente secundariaaccessed_at2026-07-29https://doi.org/10.1109/iecon48115.2021.9589498PublicacionesDeep Learning for Postharvest Decay Prediction in ApplesComunicar una corrección para este registro