S001272Official IEEE public publisher record and abstract for W001180 ICTACS 2024 wheat-yield/AGROTOOL paperDetallessource_classEditorialauthority_levelFuente primariaaccessed_at2026-08-01https://ieeexplore.ieee.org/document/10840458/PublicacionesAnalysis of the Effectiveness of Machine Learning Methods in Predicting Wheat YieldsComunicar una corrección para este registro